Atom probe microanalysis
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Atom probe microanalysis principles and applications to materials problems by M. K. Miller

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Published by Materials Research Society in Pittsburgh, Pa .
Written in English

Subjects:

  • Crystallography.,
  • Atom-probe field ion microscopy.

Book details:

Edition Notes

Includes bibliographical references and index.

StatementM.K. Miller, G.D.W. Smith.
ContributionsSmith, G. D. W.
Classifications
LC ClassificationsQD906.7.E37 M55 1989
The Physical Object
Paginationxiv, 278 p. :
Number of Pages278
ID Numbers
Open LibraryOL2195026M
ISBN 100931837995
LC Control Number89014495

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Additional Physical Format: Online version: Miller, M.K. (Michael Kenneth). Atom probe microanalysis. Pittsburgh, Pa.: Materials Research Society, © “Atom Probe Microscopy provides a much needed update on the topic and introduces the broader scientific community to this developing technique. this book fills a critical need for a revised and updated text that can educate and motivate new researchers and also provide up-to-date references for active by: The Atom Probe Focused Interest Group (AP FIG) is a community of Microscopy Society of America (MSA) members with common interest in atom probe tomography (APT) and field ion microscopy (FIM) techniques for materials characterization. We are also promoting standards as related to APT. The ions removed from the surface by field evaporation can be analyzed chemically by coupling to the microscope a time-of-flight mass spectrometer of single-particle sensitivity, known as the atom probe (AP). This article describes the principles, sample preparation, and quantitative analysis of FIM.

Atom probe microanalysis: principles and applications to materials problems Michael Kenneth Miller, George D. W. Smith Materials Research Society, - Science - pages. A. Cerezo, G.D.W. Smith, in Encyclopedia of Materials: Science and Technology, 3 Applications. Conventional atom probe analysis has been applied to a range of materials science problems where the microstructural features of interest are of nanometer dimensions. In these cases the high spatial resolution available with this technique is of critical importance. Electron probe microanalysis (EPMA) is an analytical technique that has stood the test of time. Not only is EPMA able to trace its origins back to the discovery of X-rays at the end of the nineteenth century, but the first commercial instrument appeared over 50 years ago. Nevertheless, EPMA remains a widely used technique for determiningFile Size: 5MB. Atom probe tomography is well suited to analyzing the chemistry of interfaces at the nanoscale. However, optimizing such microanalysis of interfaces requires great care in the implementation across all aspects of the technique from specimen preparation to data analysis and ultimately the .

Book Review. Atom probe microanalysis: Principles and appilcations to materials problems, by M.K. Miller and G.D.W. Smith. Materials Research Society, Pittsburgh, , pp, $ (US), $ (foreign) Alwyn Eades. Center for Microanalysis of Materials University of Illinois Urbana, Illinois. Search for more papers by this author. Alwyn : Alwyn Eades. Atom probe tomography is a three-dimensional micro- or nano-characterization technique that is routinely used to visualize and quantify the microstructure of materials at the atomic level. In this chapter, an overview of the technique of atom probe tomography is presented as . An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam, emitting x-rays at wavelengths characteristic to. Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities.